– 2019. – № 1
4. Патентная аппликация США No20180321666, 08.11.2018. METHODS AND SYSTEMS FOR EQUIPMENT
MONITORING IN AN INTERNET OF THINGS MINING ENVIRONMENT / Cella; Charles Howard; et al.
5. Патентная аппликация США No20180284753, 04.10.2018. METHODS AND SYSTEMS FOR DATA STORAGE AND COMMUNICATION IN AN INTERNET OF THINGS CHEMICAL PRODUCTION PROCESS / Cella; Charles Howard; et al.
6. Патентная аппликация США No20060036394, 16.02.2006. Universal and integrated wafer testing real-time monitoring software system and its open system architecture / Chen; Wen-Ling; et al.
7. Патентная аппликация США No20070156272, 05.07.2007. Integrated configuration, flow and execution system for semiconductor device experimental flows and production flows / Winstead; Charles H.; et al.
8. Патентная аппликация США No20060064188, 23.03.2006. Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server / Ushiku; Yukihiro; et al.
9. Патентная аппликация США No20170004985, 05.01.2017. PRODUCTION SYSTEM FOR PRINTING ELECTRONIC DEVICES / NISHI; Shinichi; et al.
10. Патентная аппликация США No20180133677, 17.05.2018. APPARATUS FOR A MASS PRODUCTION OF
MONODISPERSE BIODEGRADEABLE POLYMER-BASED MICROSPHERES AND A MULTI-CHANNEL
FORMING DEVICE INCORPORATABLE THEREIN / KIM; Ju Hee
11. Патентная аппликация США No20150066592, 05.03.2015. METHODS OF SEMICONDUCTOR MANUFACTURING AND SUPPLY CHAIN MANAGEMENT SYSTEMS / Ehm; Hans; et al.
12. Патентная аппликация США No20080008837, 10.01.2008. SUBSTRATE PROCESSING APPARATUS AND
SUBSTRATE PROCESSING METHOD FOR HEAT-TREATING SUBSTRATE / SHIBA; Yasuhiro; et al.
13. Патентная аппликация США No20050264777, 01.12.2005. High speed lithography machine and method / Gardner, Steven D.; et al.
Приложение 1.
20180321666
United States Patent Application
Kind Code
A1
Cella; Charles Howard; et al.
November 8, 2018
METHODS AND SYSTEMS FOR EQUIPMENT MONITORING IN AN INTERNET OF THINGS MINING
ENVIRONMENT
Abstract
An apparatus, methods, and systems for data collection in a production environment are described. The system may include a data collector communicatively coupled to a plurality of input channels, wherein a first subset of the plurality of input channels are connected to a first set of sensors measuring operational parameters from a production component, a data storage structured to store a plurality of collector routes and collected data, a data acquisition circuit structured to interpret a plurality of detection values from the collected data of the production component, and a data analysis circuit structured to analyze the collected data and evaluate a first collection routine of the data collector based on the analyzed collected data, wherein based on the analyzed collected data the data collector makes a collection routine change.
23
Журнал «Интернаука»
№ 16 (145), часть 2, 2020 г.
Приложение 2
United States Patent Application
20180284753
Kind Code
A1
Cella; Charles Howard; et al.
October 4, 2018
METHODS AND SYSTEMS FOR DATA STORAGE AND COMMUNICATION IN AN INTERNET OF
THINGS CHEMICAL PRODUCTION PROCESS
Abstract
A system, method and apparatus for data collection related to a chemical production process are described. The system may include a cross point switch including a plurality of inputs and a plurality of outputs, a plurality of sensors operatively coupled to at least one of a plurality of components of the chemical production process, a sensor data storage profile circuit structured to determine a data storage profile, wherein the cross point switch is responsive to the data storage profile to selectively couple at least one of the plurality of inputs to at least one of the plurality of outputs, a sensor communication circuit communicatively coupled to the plurality of outputs of the cross point switch, and a sensor data storage implementation circuit structured to store at least a portion of the plurality of sensor data values in re-sponse to the data storage profile.
Приложение 3
United States Patent Application
20060036394
Kind Code
A1
Chen; Wen-Ling; et al.
February 16, 2006
Universal and integrated wafer testing real-time monitoring software system and its open system architecture Abstract
A wafer testing real-time monitoring software system and its unique open software architecture which achieves re-al-time monitoring of wafer test results and on -line changing of externally hooked software to satisfy customer needs without changing its main program. The software structure receives and processes binary files from different probers and converts these into readable ASCII files. The system consists of four software programs that can operate independently. These programs are an automatic transfer program, a program which converts wafer test results from a binary file to an ASCII file, a program which receives the ASCII files and performs wafer map editing, and an auto-ftp program which automatically scans data and sends data to remote locations. Additionally, multiple workstations can process data from probers simultaneously. The on -line monitor on a production line can see production results from multiple major workstations through the network drive and drive mapping functions.
Приложение 4
United States Patent Application
20070156272
Kind Code
A1
Winstead; Charles H.; et al.
July 5, 2007
Integrated configuration, flow and execution system for semiconductor device experimental flows and production flows
Abstract
According to embodiments of the invention, an integrated configuration, flow and execution systems (ICFES) may be used to specify, control and record a history of processing of both semiconductor device experimental lots and pro-
duction lots of wafers. Moreover, the system allows combining of one or more partial flows of pre-existing flow blocks, and special processing into another processing flow block. A lot plan can be created that includes the flow block, and the lot plan can be updated to include partial flows and special processing before or during processing of the lot plan.
24
Журнал «Интернаука»
№ 16 (145), часть 2, 2020 г.
Приложение 5
United States Patent Application
20060064188
Kind Code
A1
Ushiku; Yukihiro; et al.
March 23, 2006
