The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:Introduction (N Tanaka)Historical Survey of the Development of STEM Instruments (N Tanaka)Basic Knowledge of STEM:Basics of STEM (N Tanaka and K Saitoh)Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)Theories of STEM Imaging:Theory for HAADF-STEM and Its Image Simulation (K Watanabe)Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)Advanced Methods in STEM:Aberration Correction in STEM (H Sawada)Secondary Electron Microscopy in STEM (H Inada and Y Zhu)Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)Electron Tomography in STEM (N Tanaka)Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)Recent Topics and Future Prospects in STEM (N Tanaka)Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.